Saf Analyses of Analog and Mixed Signal Vlsi Circuit: Digital to Analog Converter
نویسندگان
چکیده
Digital to analog converter is widely used mixed-signal circuit. Testing of analog and mixed signals faces lots of challenges due to the wide range of circuits and unavailability of one appropriate fault model. SAF (stuck_at_Fault), Stuck_open and stuck_short fault model at transistor level is used in this paper. Further these fault models are used to analyze the effects on the characteristics parameter of 3-bit R-2R DAC.
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تاریخ انتشار 2015